"The split boundary scan register technique for testing board interconnects."

Nazar S. Haider, Nick Kanopoulos (1992)

Details and statistics

DOI: 10.1109/VTEST.1992.232722

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics