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"Diagnostic of path and gate delay faults in non-scan sequential circuits."

Patrick Girard et al. (1995)

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DOI: 10.1109/VTEST.1995.512664

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/GirardLPR95
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  persistent URL:
  - https://dblp.org/rec/conf/vts/GirardLPR95
Patrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez:
Diagnostic of path and gate delay faults in non-scan sequential circuits. VTS 1995: 380-386

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