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"A Modified Clock Scheme for a Low Power BIST Test Pattern Generator."

Patrick Girard et al. (2001)

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DOI: 10.1109/VTS.2001.923454

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/GirardGLPW01
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  persistent URL:
  - https://dblp.org/rec/conf/vts/GirardGLPW01
Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Hans-Joachim Wunderlich:
A Modified Clock Scheme for a Low Power BIST Test Pattern Generator. VTS 2001: 306-311

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