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"Test pattern generation for I_DDQ: increasing test quality."

Marcello Dalpasso, Michele Favalli, Piero Olivo (1995)

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DOI: 10.1109/VTEST.1995.512653

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/DalpassoFO95
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  persistent URL:
  - https://dblp.org/rec/conf/vts/DalpassoFO95
Marcello Dalpasso, Michele Favalli, Piero Olivo:
Test pattern generation for I_DDQ: increasing test quality. VTS 1995: 304-309

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