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"Reducing test time and area overhead of an embedded memory array built-in ..."

Jaeyong Chung et al. (2010)

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DOI: 10.1109/VTS.2010.5469625

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-05

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Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo:
Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. VTS 2010: 33-38

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