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"Test cost optimization technique for the pre-bond test of 3D ICs."

Yong-Xiao Chen, Yu-Jen Huang, Jin-Fu Li (2012)

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DOI: 10.1109/VTS.2012.6231087

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Yong-Xiao Chen, Yu-Jen Huang, Jin-Fu Li:
Test cost optimization technique for the pre-bond test of 3D ICs. VTS 2012: 102-107

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