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"Non-robust tests for stuck-fault detection using signal waveform analysis: ..."

Abhijit Chatterjee et al. (1996)

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DOI: 10.1109/VTEST.1996.510879

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/ChatterjeeJPA96
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  persistent URL:
  - https://dblp.org/rec/conf/vts/ChatterjeeJPA96
Abhijit Chatterjee, Rathish Jayabharathi, Pankaj Pant, Jacob A. Abraham:
Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages. VTS 1996: 354-361

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