"Test Generation for Maximizing Ground Bounce for Internal Circuitry with ..."

Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer (2001)

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DOI: 10.1109/VTS.2001.923463

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-21

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Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer:
Test Generation for Maximizing Ground Bounce for Internal Circuitry with Reconvergent Fan-out. VTS 2001: 358-367

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