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"Can Defect-Tolerant Chips Better Meet the Quality Challenge?"
R. L. Campbell et al. (1996)
- R. L. Campbell, P. Kuekes, David Y. Lepejian, Wojciech P. Maly, Michael Nicolaidis, Alex Orailoglu:
Can Defect-Tolerant Chips Better Meet the Quality Challenge? VTS 1996: 362-363
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