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"An investigation of circuit partitioning for parallel test generation."

S. Wayne Bollinger, Scott F. Midkiff (1992)

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DOI: 10.1109/VTEST.1992.232735

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/BollingerM92
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  persistent URL:
  - https://dblp.org/rec/conf/vts/BollingerM92
S. Wayne Bollinger, Scott F. Midkiff:
An investigation of circuit partitioning for parallel test generation. VTS 1992: 119-124

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