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"H-SCAN: A high level alternative to full-scan testing with reduced area ..."

Subhrajit Bhattacharya, Sujit Dey (1996)

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DOI: 10.1109/VTEST.1996.510838

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/BhattacharyaD96
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  persistent URL:
  - https://dblp.org/rec/conf/vts/BhattacharyaD96
Subhrajit Bhattacharya, Sujit Dey:
H-SCAN: A high level alternative to full-scan testing with reduced area and test application overheads. VTS 1996: 74-80

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