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"New Test Methodology for Resistive Open Defect Detection in Memory Address ..."

Mohamed Azimane, Ananta K. Majhi (2004)

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DOI: 10.1109/VTEST.2004.1299235

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/AzimaneM04
Mohamed Azimane, Ananta K. Majhi:
New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders. VTS 2004: 123-128

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