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"Parametric and Catastrophic Fault Coverage of Analog Circuits in ..."

Karim Arabi, Bozena Kaminska (1997)

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DOI: 10.1109/VTEST.1997.600246

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Karim Arabi, Bozena Kaminska:
Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. VTS 1997: 166-171

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