"Test-cost optimization and test-flow selection for 3D-stacked ICs."

Mukesh Agrawal, Krishnendu Chakrabarty (2013)

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DOI: 10.1109/VTS.2013.6548941

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Mukesh Agrawal, Krishnendu Chakrabarty:
Test-cost optimization and test-flow selection for 3D-stacked ICs. VTS 2013: 1-6

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