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"Exploiting Engineered IQ Samples for Physical Layer Authentication."

Hossien B. Eldeeb et al. (2023)

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DOI: 10.1109/VTC2023-FALL60731.2023.10333349

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-10

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Hossien B. Eldeeb, Anshul Pandey, Martin Andreoni Lopez, Sami Muhaidat:
Exploiting Engineered IQ Samples for Physical Layer Authentication. VTC Fall 2023: 1-6

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