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"Chip Surface Defect Detection Algorithm Based on Improved YOLOv3."

Biao Zhou et al. (2023)

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DOI: 10.1145/3638682.3638703

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-31

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  dblp key:
  - conf/vsip/ZhouYZC023
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  - https://dblp.org/rec/conf/vsip/ZhouYZC023
Biao Zhou, Xiaoyu Yu, Yang Zhang, Haisong Chen, Aili Wang:
Chip Surface Defect Detection Algorithm Based on Improved YOLOv3. VSIP 2023: 134-142

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