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"A stochastic V2V LOS/NLOS model using neural networks for ..."
Christina Stadler et al. (2017)
- Christina Stadler, Xenia Flamm, Thomas Gruber, Anatoli Djanatliev, Reinhard German, David Eckhoff:
A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing. VNC 2017: 195-202
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