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"Experimental Demonstration of Probabilistic-Bit (p-bit) Utilizing ..."

Seongjae Heo et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185217

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-28

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Seongjae Heo, Dongmin Kim, Wooseok Choi, Sanghyun Ban, Ohhyuk Kwon, Hyunsang Hwang:
Experimental Demonstration of Probabilistic-Bit (p-bit) Utilizing Stochastic Oscillation of Threshold Switch Device. VLSI Technology and Circuits 2023: 1-2

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