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"Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC."

Hiroyuki Yotsuyanagi et al. (2009)

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DOI: 10.1109/VLSI.DESIGN.2009.60

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/YotsuyanagiHTYAHTT09
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/YotsuyanagiHTYAHTT09
Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu:
Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. VLSI Design 2009: 91-96

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