"WOR-BIST: A Complete Test Solution for Designs Meeting Power, Area and ..."

Chunhua Yao, Kewal K. Saluja, Abhishek A. Sinkar (2009)

Details and statistics

DOI: 10.1109/VLSI.DESIGN.2009.74

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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