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"Voltage and Temperature Scalable Standard Cell Leakage Models Based on ..."

Janakiraman Viraraghavan, Bishnu Prasad Das, Bharadwaj Amrutur (2008)

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DOI: 10.1109/VLSI.2008.38

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Janakiraman Viraraghavan, Bishnu Prasad Das, Bharadwaj Amrutur:
Voltage and Temperature Scalable Standard Cell Leakage Models Based on Stacks for Statistical Leakage Characterization. VLSI Design 2008: 667-672

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