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"Path Delay Fault Test Generation for Standard Scan Designs Using State Tuples."

Yun Shao, Irith Pomeranz, Sudhakar M. Reddy (2002)

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DOI: 10.1109/ASPDAC.2002.995026

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-14

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  dblp key:
  - conf/vlsid/ShaoPR02
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/ShaoPR02
Yun Shao, Irith Pomeranz, Sudhakar M. Reddy:
Path Delay Fault Test Generation for Standard Scan Designs Using State Tuples. ASP-DAC/VLSI Design 2002: 767-772

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