"A genetic approach to test application time reduction for full scan and ..."

Elizabeth M. Rudnick, Janak H. Patel (1995)

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DOI: 10.1109/ICVD.1995.512126

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Elizabeth M. Rudnick, Janak H. Patel:
A genetic approach to test application time reduction for full scan and partial scan circuits. VLSI Design 1995: 288-293

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