"Computational Complexity of Test-Point Insertions and Decompositions."

Nageswara S. V. Rao, Shunichi Toida (1992)

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DOI: 10.1109/ICVD.1992.658053

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Nageswara S. V. Rao, Shunichi Toida:
Computational Complexity of Test-Point Insertions and Decompositions. VLSI Design 1992: 233-238

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