"A Built-in-Self-Test Scheme for Digital to Analog Converters."

Sunil Rafeeque, Vinita Vasudevan (2004)

Details and statistics

DOI: 10.1109/ICVD.2004.1261065

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

a service of  Schloss Dagstuhl - Leibniz Center for Informatics