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"The Impact of Inductance on Transients Affecting Gate Oxide Reliability."

N. S. Nagaraj et al. (2005)

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DOI: 10.1109/ICVD.2005.164

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/NagarajHBC05
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/NagarajHBC05
N. S. Nagaraj, William R. Hunter, Poras T. Balsara, Cyrus D. Cantrell:
The Impact of Inductance on Transients Affecting Gate Oxide Reliability. VLSI Design 2005: 709-713

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