BibTeX record conf/vlsid/LiWCR05

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@inproceedings{DBLP:conf/vlsid/LiWCR05,
  author    = {Wei Li and
               Seongmoon Wang and
               Srimat T. Chakradhar and
               Sudhakar M. Reddy},
  title     = {Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage},
  booktitle = {18th International Conference on {VLSI} Design {(VLSI} Design 2005),
               with the 4th International Conference on Embedded Systems Design,
               3-7 January 2005, Kolkata, India},
  pages     = {471--478},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://doi.org/10.1109/ICVD.2005.83},
  doi       = {10.1109/ICVD.2005.83},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/vlsid/LiWCR05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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