Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level ..."

Yoshinobu Higami et al. (2007)

> Home

Details and statistics

DOI: 10.1109/VLSID.2007.83

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/HigamiSTT07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/HigamiSTT07
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Yuzo Takamatsu:
Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation. VLSI Design 2007: 781-786

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.