"A Unified Solution to Scan Test Volume, Time, and Power Minimization."

Zhen Chen et al. (2010)

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DOI: 10.1109/VLSI.DESIGN.2010.44

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya:
A Unified Solution to Scan Test Volume, Time, and Power Minimization. VLSI Design 2010: 9-14

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