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ORCID"Optimizing Test Hardware for At-Speed Testing of Datapaths in an ..."
Debashis Bhattacharya, Smith Freeman, Bill Lin (1997)
- Debashis Bhattacharya, Smith Freeman, Bill Lin:
Optimizing Test Hardware for At-Speed Testing of Datapaths in an Integrated Circuit. VLSI Design 1997: 289-296
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