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ORCID"DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield."
David Abercrombie et al. (2006)
- David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman:
DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design 2006: 14
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