"Challenges for high-density 16Gb ReRAM with 27nm technology."

Scott Sills et al. (2015)

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DOI: 10.1109/VLSIC.2015.7231366

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Scott Sills, Shuichiro Yasuda, Alessandro Calderoni, Christopher Cardon, Jonathan Strand, Katsuhisa Aratani, Nirmal Ramaswamy:
Challenges for high-density 16Gb ReRAM with 27nm technology. VLSIC 2015: 106-

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