"Tagged probabilistic simulation based error probability estimation for ..."

Amr M. S. Tosson, Siddharth Garg, Mohab H. Anis (2013)

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DOI: 10.1109/VLSI-SOC.2013.6673311

access: closed

type: Conference or Workshop Paper

metadata version: 2017-07-26

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Amr M. S. Tosson, Siddharth Garg, Mohab H. Anis:
Tagged probabilistic simulation based error probability estimation for better-than-worst case circuit design. VLSI-SoC 2013: 368-373

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