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"BIST Scheme for Low Heat Dissipation and Reduced Test Application Time."

Malav Shah, Dipankar Nagchoudhuri (2006)

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DOI: 10.1109/VLSISOC.2006.313240

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Malav Shah, Dipankar Nagchoudhuri:
BIST Scheme for Low Heat Dissipation and Reduced Test Application Time. VLSI-SoC 2006: 239-244

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