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"Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations."

Andres F. Gomez et al. (2018)

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DOI: 10.1109/VLSI-SOC.2018.8645022

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-05

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  dblp key:
  - conf/vlsi/GomezFRC18
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  - https://dblp.org/rec/conf/vlsi/GomezFRC18
Andres F. Gomez, Freddy Forero, Kaushik Roy, Víctor H. Champac:
Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations. VLSI-SoC 2018: 65-70

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