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"Meta-model Based Automation of Properties for Pre-Silicon Verification."

Keerthikumara Devarajegowda, Wolfgang Ecker (2018)

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DOI: 10.1109/VLSI-SOC.2018.8644957

access: closed

type: Conference or Workshop Paper

metadata version: 2019-02-26

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  - conf/vlsi/DevarajegowdaE18
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  - https://dblp.org/rec/conf/vlsi/DevarajegowdaE18
Keerthikumara Devarajegowda, Wolfgang Ecker:
Meta-model Based Automation of Properties for Pre-Silicon Verification. VLSI-SoC 2018: 231-236

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