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"Improving post-silicon error detection with topological selection of trace ..."

Binod Kumar et al. (2017)

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DOI: 10.1109/VLSI-SOC.2017.8203485

access: closed

type: Conference or Workshop Paper

metadata version: 2017-12-19

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  dblp key:
  - conf/vlsi/0001BJFS17
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Binod Kumar, Kanad Basu, Ankit Jindal, Masahiro Fujita, Virendra Singh:
Improving post-silicon error detection with topological selection of trace signals. VLSI-SoC 2017: 1-6

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