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"A hybrid built-in self-test scheme for DRAMs."
Chi-Chun Yang et al. (2015)
- Chi-Chun Yang, Jin-Fu Li, Yun-Chao Yu, Kuan-Te Wu, Chih-Yen Lo, Chao-Hsun Chen, Jenn-Shiang Lai, Ding-Ming Kwai, Yung-Fa Chou:
A hybrid built-in self-test scheme for DRAMs. VLSI-DAT 2015: 1-4
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