BibTeX record conf/vlsi-dat/YangLWL19

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@inproceedings{DBLP:conf/vlsi-dat/YangLWL19,
  author    = {Kai{-}Chieh Yang and
               Ming{-}Ting Lee and
               Chen{-}Hung Wu and
               James Chien{-}Mo Li},
  title     = {{ATPG} and Test Compression for Probabilistic Circuits},
  booktitle = {International Symposium on {VLSI} Design, Automation and Test, {VLSI-DAT}
               2019, Hsinchu, Taiwan, April 22-25, 2019},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/VLSI-DAT.2019.8741869},
  doi       = {10.1109/VLSI-DAT.2019.8741869},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/vlsi-dat/YangLWL19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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