"A test-application-count based learning technique for test time reduction."

Guo-Yu Lin et al. (2015)

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DOI: 10.1109/VLSI-DAT.2015.7114507

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Guo-Yu Lin, Kun-Han Tsai, Jiun-Lang Huang, Wu-Tung Cheng:
A test-application-count based learning technique for test time reduction. VLSI-DAT 2015: 1-4

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