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"Reversible Scan Based Diagnostic Patterns."

Yu Huang et al. (2019)

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DOI: 10.1109/VLSI-DAT.2019.8742079

access: closed

type: Conference or Workshop Paper

metadata version: 2019-08-13

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  - https://dblp.org/rec/conf/vlsi-dat/HuangUCSNZH19
Yu Huang, Szczepan Urban, Wu-Tung Cheng, Manish Sharma, Fengju Niu, Junna Zhong, Wen-Lung Hsu:
Reversible Scan Based Diagnostic Patterns. VLSI-DAT 2019: 1-4

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