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"Novel test analysis to improve structural coverage - A commercial experiment."

Wen Chen et al. (2013)

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DOI: 10.1109/VLDI-DAT.2013.6533851

access: closed

type: Conference or Workshop Paper

metadata version: 2017-10-18

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  - conf/vlsi-dat/ChenWBA13
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Wen Chen, Li-C. Wang, Jayanta Bhadra, Magdy S. Abadir:
Novel test analysis to improve structural coverage - A commercial experiment. VLSI-DAT 2013: 1-4

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