"Ultra-low-leakage power-rail ESD clamp circuit in a 65-nm CMOS technology."

Federico A. Altolaguirre, Ming-Dou Ker (2013)

Details and statistics

DOI: 10.1109/VLDI-DAT.2013.6533866

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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