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"Impact of Fin Width and Graded Channel Doping on the Performance of 22nm ..."

Jose Joseph, Rajendra M. Patrikar (2013)

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DOI: 10.1007/978-3-642-42024-5_19

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-13

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Jose Joseph, Rajendra M. Patrikar:
Impact of Fin Width and Graded Channel Doping on the Performance of 22nm SOI FinFET. VDAT 2013: 153-159

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