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"Statistical Variation Aware Leakage and Total Power Estimation of 16 nm ..."

Deepthi Amuru, Andleeb Zahra, Zia Abbas (2019)

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DOI: 10.1007/978-981-32-9767-8_47

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

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  dblp key:
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Deepthi Amuru, Andleeb Zahra, Zia Abbas:
Statistical Variation Aware Leakage and Total Power Estimation of 16 nm VLSI Digital Circuits Based on Regression Models. VDAT 2019: 565-578

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