"A flexible dual frequency testbed for RFID."

Christoph Angerer et al. (2008)

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DOI: 10.4108/TRIDENTCOM.2008.3138

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-27

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  - https://dblp.org/rec/conf/tridentcom/AngererHKR08
Christoph Angerer, Martin Holzer, Bastian Knerr, Markus Rupp:
A flexible dual frequency testbed for RFID. TRIDENTCOM 2008: 3

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