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"Temperature Reliability of Junctionless Twin Gate Recessed Channel ..."

Ajay Kumar et al. (2018)

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DOI: 10.1109/TENCON.2018.8650267

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Ajay Kumar, Samarth Singh, Balark Tiwari, Rishu Chaujar:
Temperature Reliability of Junctionless Twin Gate Recessed Channel (JL-TGRC) MOSFET with Different Gate Material for Low Power Digital-Logic Applications. TENCON 2018: 1070-1074

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