"From Modeling to Test Case Generation in the Industrial Embedded System ..."

Aliya Hussain et al. (2018)

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DOI: 10.1007/978-3-030-04771-9_35

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-23

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Aliya Hussain, Saurabh Tiwari, Jagadish Suryadevara, Eduard Enoiu:
From Modeling to Test Case Generation in the Industrial Embedded System Domain. STAF Workshops 2018: 499-505

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