"Pairwise Testing in the Presence of Configuration Change Cost."

Shin Kimoto, Tatsuhiro Tsuchiya, Tohru Kikuno (2008)

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DOI: 10.1109/SSIRI.2008.27

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Shin Kimoto, Tatsuhiro Tsuchiya, Tohru Kikuno:
Pairwise Testing in the Presence of Configuration Change Cost. SSIRI 2008: 32-38

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