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"µTIL: Mutation-based Statistical Test Inputs Generation for ..."
Mickaël Delahaye et al. (2012)
- Mickaël Delahaye, Lionel C. Briand, Arnaud Gotlieb, Matthieu Petit:
µTIL: Mutation-based Statistical Test Inputs Generation for Automatic Fault Localization. SERE 2012: 197-206
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